English
Chipkartenprozesstechnik
Montagetechnik
Service
BT110-3 bending stress tester  

application
•  test of bending endurance of cards, ID-1 format

description
•  test specification according to ISO/IEC 10373-1/2006 (E)
    "Identification cards - Test methods - Part1: General
    characteristics", section "5.8 Dynamic bending stress"
•  1- 2 x 5 card spaces
•  test frequency f = 0.5 Hz
•  pre-setting of test cycles
•  automatic stop after reaching of pre-set test cycle and message
    about completeness
•  retainer: 5 spaces in portrait format (bending along the short
                  axis),
                  5 spaces in landscape format (bending along the long
                  axis)

benefits & features
•  long-term bending stress testing according to ISO standard 
    for ID-1 formats

Application & Details 
Copyright © 2007 ruhlamat Automatisierungstechnik GmbH. All rights reserved.